On conditioning: Reduction of secondary- and rf-field emission by electron, photon, or helium impact
- 1 September 1982
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 53 (9) , 6475-6478
- https://doi.org/10.1063/1.331493
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
- ESD on metal oxides and oxygen adsorption layers: Evidence for different mechanisms in electron stimulated desorptionSurface Science, 1981
- The chemical makeup of Nb and Nb3Sn filmsPhysica B+C, 1981
- Measurement of a superconducting 500 MHz Nb cavity in the TM010-ModeNuclear Instruments and Methods, 1981
- Electron beam damage in Auger electron spectroscopyApplications of Surface Science, 1981
- On surface coatings and secondary yield of Nb3Sn and NbJournal of Applied Physics, 1980
- Electron spectroscopy of condensed multilayers: Line shape changes due to beam damage and excitation modeSurface Science, 1979
- The adsorption of cycloparaffins on Ru(001) as studied by temperature programmed desorption and electron stimulated desorptionSurface Science, 1978
- Some problems encountered in secondary ion emission applied to elementary analysisSurface Science, 1975
- Scattering mechanisms in low-energy e-H2O collisionsJournal of Physics B: Atomic and Molecular Physics, 1974
- Evidence for surface-state-enhanced field emission in rf superconducting cavitiesJournal of Applied Physics, 1974