Characterization of anodic sulfide films on Hg0.78Cd0.22Te
- 1 September 1987
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology A
- Vol. 5 (5) , 3207-3210
- https://doi.org/10.1116/1.574839
Abstract
Anodic sulfide films were grown on HgCdTe and studied by Auger electron spectroscopy, surface analysis by laser ionization, Rutherford backscattering spectroscopy, Raman and photoluminescence spectroscopy, and high-resolution transmission electron microscopy to determine their elemental composition and their chemical and physical structure. This information, when coupled with a knowledge of the possible chemical reactions at the interface between the film and the HgCdTe substrate, explains why anodic surface films are more thermally stable than anodic oxide films.Keywords
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