Transport and relaxation of hot conduction electrons in an organic dielectric

Effective mean free paths of hot electrons in the energy range 0.5 eV≤$E_{\mathrm{kin}\mathrm{\le }20}$ eV are determined experimentally for the paraffin n-${\mathrm{C}}_{36}$ ${\mathrm{H}}_{74}$ with the internal photoemission for transport analysis method. The hot-electron transport parameters are discussed in terms of fundamental scattering mechanisms in organic dielectrics. The influence of hot-electron-induced trap formation on the transport properties is investigated. The consequences for dielectric breakdown are pointed out.