The Fail-Safe Feature of the Lapp & Powers Fault Tree
- 1 April 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-29 (1) , 10-11
- https://doi.org/10.1109/TR.1980.5220686
Abstract
In response to the Editor's suggestion, 3 states of the Lapp & Powers fault-tree model are distinguished, `good', `failed safe' and `failed unsafe'. Both the logical and the probability functions are given separately for both failed safe and good events as well as the probability calculations. A simplified 2-component example is also discussed to illustrate the relationship between XOR gates in fault trees and fail-safe systems and subsystems.Keywords
This publication has 2 references indexed in Scilit:
- Synthesis of Fault Trees: An Example of NoncoherenceIEEE Transactions on Reliability, 1979
- Update of Lapp-Powers Fault-Tree Synthesis AlgorithmIEEE Transactions on Reliability, 1979