WORK FUNCTION AND PHOTOELECTRIC MEASUREMENTS ON CLEAVED SILICON SURFACES
- 22 December 2006
- journal article
- Published by Wiley in Annals of the New York Academy of Sciences
- Vol. 101 (3) , 647-657
- https://doi.org/10.1111/j.1749-6632.1963.tb54921.x
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Transition Probability for Photoelectric Emission from SemiconductorsPhysical Review B, 1953
- Photoelectric Emission and Contact Potentials of SemiconductorsPhysical Review B, 1948