A threshold photoelectron–photoion coincidence study of the N2O+ dissociation between 15 and 20.5 eV
- 15 June 1980
- journal article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 72 (12) , 6587-6592
- https://doi.org/10.1063/1.439115
Abstract
Branching ratios and the kinetic energy released in the various fragmentation channels of energy selected N2O+ (15–20.5 eV) were investigated by the technique of threshold photoelectron–photoion coincidence. Pulsed synchrotron radiation from ACO, Orsay’s storage ring, dispersed by a monochromator, was used as a photon source. Threshold electrons were energy selected on the basis of angular and temporal discrimination against energetic electrons. The energy region below 16.388 eV and the ? state were investigated in detail. Below the ? state the most abundant fragment ion is O+, while above the ? state NO+ dominates. Results for the ? and ? states are also reported.Keywords
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