Crystal structures and their secondary ion mass spectra
- 31 January 1975
- journal article
- Published by Elsevier in Surface Science
- Vol. 47 (1) , 344-357
- https://doi.org/10.1016/0039-6028(75)90299-x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)Surface Science, 1973
- Application of characteristic secondary ion mass spectra to a depth analysis of copper oxide on copperRadiation Effects, 1973
- Electronic Characterization of Solid SurfacesScience, 1972
- An Analytical System for Secondary Ion Mass Spectrometry in Ultra High VacuumJournal of Vacuum Science and Technology, 1972
- Über den α‐Fe‐FeAl2O4‐Mischkristall in aktivierten AmmoniakkatalysatorenBerichte der Bunsengesellschaft für physikalische Chemie, 1966