XPS and static SIMS studies of copoly(ether-esters) containing mixed polyether soft blocks
- 1 August 1994
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 21 (8) , 553-559
- https://doi.org/10.1002/sia.740210807
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- X-ray photoelectron and static secondary-ion mass spectroscopic studies of segmented block copoly(ether-ester)sPolymer, 1991
- Surface studies of polyether–polyester copolymers and blendsJournal of Vacuum Science & Technology A, 1990
- SIMS and XPS studies of polyurethane surfaces. 1. Preliminary studiesMacromolecules, 1988