An efficient partitioning strategy for pseudo-exhaustive testing

• 1 January 1993
• conference paper
• Published by Association for Computing Machinery (ACM)
• p. 242-248
• https://doi.org/10.1145/157485.164880

Abstract

Keywords

• PSEUDO-EXHAUSTIVE TESTING
• EFFICIENT PARTITIONING STRATEGY
• POLYNOMIALS
• COMBINATIONAL CIRCUITS
• SEQUENTIAL ANALYSIS
• FAULT DETECTION
• BENCHMARK TESTING
• HARDWARE