Simultaneous Determination of the Thickness and Composition of Thin Film Samples using Fundamental Parameters
- 1 January 1988
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Versatile x-ray analysis program combining fundamental parameters and empirical coefficientsAnalytical Chemistry, 1978
- Calculation methods for fluorescent x-ray spectrometry. Empirical coefficients versus fundamental parametersAnalytical Chemistry, 1968