High-resolution OCDR in dispersive waveguides

Publisher Website
Google Scholar
Abstract
In the analysis of integrated optical waveguide structures by coherence-domain reflectometry, spatial resolution may be seriously impaired by second order dispersion of the waveguides under test and by the presence of structures in the source spectrum. An algorithm for evaluation of measured interferograms is presented to correct for these effects. It is based on Fourier and wavenumber scale transformations.

This publication has 0 references indexed in Scilit: