Requirements for noise parameter measurements in superconducting electronic systems
- 1 January 1991
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
General considerations on the measurement of noise parameters in highly mismatched systems are discussed. In particular, the problem of noise characterization of active superconducting microwave devices is addressed. A measurement technique that includes an error analysis is presented along with current data for a superconducting flux flow transistor.Peer ReviewedPostprint (published versionKeywords
This publication has 2 references indexed in Scilit:
- Microwave noise parameter measurements of a high temperature superconducting flux flows transistorIEEE Transactions on Magnetics, 1991
- A vector approach for noise parameter fitting and selection of source admittancesIEEE Transactions on Microwave Theory and Techniques, 1991