A knowledge-based system for selecting test methodologies
- 1 October 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Design & Test of Computers
- Vol. 5 (5) , 41-59
- https://doi.org/10.1109/54.7981
Abstract
A prototype knowledge-based system that helps select test methodologies for a particular type of logic structure is described. The system, called TDES, (testable design expert system), is a subsystem of Adam, an advanced design automation system. The system is being used to test programmable logic arrays, but its architecture is applicable to other types of structures such as RAMs, ROMs, and other combinational logic. It uses a divide-and-conquer (partitioning) strategy and works interactively with a user as an intelligent consultant and assistant.<>Keywords
This publication has 4 references indexed in Scilit:
- Analysis of testable PLA designsIEEE Design & Test of Computers, 1988
- A Knowledge-Based System for Designing Testable VLSI ChipsIEEE Design & Test of Computers, 1985
- The ADAM Advanced Design Automation System: Overview, Planner and Natural Language InterfacePublished by Institute of Electrical and Electronics Engineers (IEEE) ,1985
- Design for Testability—A SurveyIEEE Transactions on Computers, 1982