Modeling of correlated failures and community error recovery in multiversion software
- 1 March 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Software Engineering
- Vol. 16 (3) , 350-359
- https://doi.org/10.1109/32.48942
Abstract
Three aspects of the modeling of multiversion software are considered. First, the beta-binomial distribution is proposed for modeling correlated failures in multiversion software. Second, a combinatorial model for predicting the reliability of a multiversion software configuration is presented. This model can take as inputs failure distributions either from measurements or from a selected distribution (e.g. beta-binomial). Various recovery methods can be incorporated in this model. Third, the effectiveness of the community error recovery method based on checkpointing is investigated. This method appears to be effective only when the failure behaviors of program versions are lightly correlated. Two different types of checkpoint failure are also considered: an omission failure where the correct output is recognized at a checkpoint but the checkpoint fails to correct the wrong outputs and a destructive failure where the good versions get corrupted at a checkpoint.Keywords
This publication has 6 references indexed in Scilit:
- A CONCEPTUAL MODEL OF MULTI-VERSION SOFTWAREPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- A large scale second generation experiment in multi-version software: description and early resultsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- An experimental evaluation of the assumption of independence in multiversion programmingIEEE Transactions on Software Engineering, 1986
- The N-Version Approach to Fault-Tolerant SoftwareIEEE Transactions on Software Engineering, 1985
- A Theoretical Basis for the Analysis of Multiversion Software Subject to Coincident ErrorsIEEE Transactions on Software Engineering, 1985
- System structure for software fault toleranceIEEE Transactions on Software Engineering, 1975