High-speed X-ray analysis

• 1 August 1978
• journal article
• Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
• Vol. 11  (4) , 229-233
• https://doi.org/10.1107/s0021889878013217

Abstract

Keywords

• FITTING METHOD
• THRESHOLD LEVEL
• PROFILE FITTING
• FLUORESCENCE
• SPECTROSCOPY
• INTENSITY THRESHOLD
• CONTROLLED DIFFRACTOMETER
• MICROPROBE ANALYSIS
• PRECISE VALUES
• CRYSTAL DIFFRACTOMETRY