Post‐1989 calibration energies for X‐ray photoelectron spectrometers and the 1990 Josephson constant
- 1 August 1989
- journal article
- letter
- Published by Wiley in Surface and Interface Analysis
- Vol. 14 (8) , 488
- https://doi.org/10.1002/sia.740140813
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- News from the BIPMMetrologia, 1989
- New International Electrical Reference Standards Based on the Josephson and Quantum Hall EffectsMetrologia, 1989
- XPS: Energy calibration of electron spectrometers. 2—Results of an interlaboratory comparisonSurface and Interface Analysis, 1984
- The 1973 Least-Squares Adjustment of the Fundamental ConstantsJournal of Physical and Chemical Reference Data, 1973
- News from the Bureau International des Poids et MesuresMetrologia, 1973