Imaging of sub-unit-cell structures in the contact mode of the scanning force microscope
- 15 January 1999
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 59 (3) , 1661-1664
- https://doi.org/10.1103/physrevb.59.1661
Abstract
An experimental and theoretical study on the nature of the movement of a scanned tip on a surface is presented, which examines the consequences of the applied loading force on the resolution of sub-unit-cell structures of a scanning force microscope operated in contact mode. By comparison of experimental and simulated force maps it is found that the so-called “stick-slip” movement of the tip depends strongly on the applied loading force. This effect has significant consequences on the resolution of the examined nontrivial unit cell of
Keywords
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