Density functional theory of high-k dielectric gate stacks
- 1 April 2007
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 47 (4-5) , 686-693
- https://doi.org/10.1016/j.microrel.2007.02.009
Abstract
No abstract availableThis publication has 76 references indexed in Scilit:
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