Probability of-Shell Internal Ionization in the Beta Decay of
- 1 December 1972
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review C
- Vol. 6 (6) , 2189-2193
- https://doi.org/10.1103/physrevc.6.2189
Abstract
The -shell internal ionization probability for the decay of has been measured using a high-resolution Si(Li) x-ray spectrometer. Absolute source strengths were determined on the basis of source weight and also from an analysis of the intensities of Tc x rays produced during irradiations with 60-MeV particles. A value of (3.89 ± 0.16) × per decay was obtained for the -shell internal-ionization probability. This result is compared with the predictions of various theories of electron shakeoff.
Keywords
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