Probability ofK-Shell Internal Ionization in the Beta Decay ofTc99

Abstract
The K-shell internal ionization probability for the decay of Tc99 has been measured using a high-resolution Si(Li) x-ray spectrometer. Absolute source strengths were determined on the basis of source weight and also from an analysis of the intensities of Tc K x rays produced during irradiations with 60-MeV α particles. A value of (3.89 ± 0.16) × 104 per β decay was obtained for the K-shell internal-ionization probability. This result is compared with the predictions of various theories of electron shakeoff.