Oxidation of copper and mobility of copper ions during anodizing of an Al—1.5 wt.% Cu alloy

This publication has 9 references indexed in Scilit:

• A novel marker for the determination of transport numbers during anodic barrier oxide growth on aluminium
  Philosophical Magazine Part B, 1991
• Anodic oxidation of aluminium
  Philosophical Magazine Part B, 1987
• Cross sections for 170° backscattering of 4He from oxygen, aluminum and argon for 4He energies between 1.8 and 5.0 MeV
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
• Barrier‐Type anodic films on aluminium in aqueous borate solutions: 1—Film density and stopping power of anodic alumina films for alpha particles
  Surface and Interface Analysis, 1983
• The application of ultramicrotomy to the electronoptical examination of surface films on aluminium
  Corrosion Science, 1978
• The Use of Rutherford Backscattering to Study the Behavior of Ion-Implanted Atoms During Anodic Oxidation of Aluminum: Ar, Kr, Xe, K, Rb, Cs, Cl, Br, and l
  Journal of the Electrochemical Society, 1973
• Aluminum + water reaction
  Transactions of the Faraday Society, 1969
• HIGH RESISTANCE ANODIC OXIDE FILMS ON ALUMINIUM
  Canadian Journal of Chemistry, 1966
• Determination of Barrier Layer Thickness of Anodic Oxide Coatings
  Journal of the Electrochemical Society, 1954