High near-infrared reflectivity modulation with polycrystalline electrochromic WO3 films
- 15 December 1983
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 43 (12) , 1093-1095
- https://doi.org/10.1063/1.94254
Abstract
A near‐infrared reflectivity exceeding 60% at 2.5‐μm wavelength has been observed for a polycrystalline, rf sputter‐deposited electrochromic (EC) WO3 film in a deeply colored state. This reflectivity is considerably higher than that previously reported for a thermally evaporated EC‐WO3 film that was crystallized by a post‐deposition thermal anneal. The shapes of the x‐ray spectra of the two films are also different. The results of ellipsometry measurements of the optical constants provide convincing evidence for the validity of a free‐electron Drude model to explain the reflectivity modulation observed in polycrystalline EC‐WO3.Keywords
This publication has 3 references indexed in Scilit:
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- Transition metal oxide electrochromic materials and displays: a review: Part 2: oxides with anodic colorationDisplays, 1982
- Dependence of WO 3 Electrochromic Absorption on CrystallinityJournal of the Electrochemical Society, 1977