In situ RHEED and XPS studies of epitaxial thin α-Fe2O3(0001) films on sapphire
- 1 November 1996
- journal article
- Published by Elsevier in Surface Science
- Vol. 366 (3) , 579-586
- https://doi.org/10.1016/0039-6028(96)00844-8
Abstract
No abstract availableKeywords
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