Neutron diffraction on the diluted magnetic semiconductor Sn1−xMnxTe

Abstract
In the diluted magnetic semiconductor Sn1−xMnxTe, magnetic ordering occurs at low temperature when the charge carrier density p exceeds a critical value. By means of single‐crystal neutron diffraction on samples with x=0.03, p = 7 × 1020 cm−3 and x=0.06, p = 11 × 1020 cm−3, we have shown that this ordered phase is ferromagnetic. For the 6% Mn crystal indications were found for magnetic fluctuations just below the ordering temperature. The experimental results rule out the existence of a (reentrant) spin‐glass phase at these Mn concentrations and charge carrier densities.