Novel aspects of mid and far IR Fourier spectroscopy applied to surface and adsorption studies on SiO2
- 1 September 1987
- journal article
- Published by Elsevier in Surface Science
- Vol. 188 (1-2) , 181-198
- https://doi.org/10.1016/s0039-6028(87)80150-4
Abstract
No abstract availableKeywords
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