6H-SiC{0001} X-ray photoelectron diffraction characterization used for polarity determination
- 9 October 1998
- journal article
- Published by Elsevier in Surface Science
- Vol. 415 (3) , 392-402
- https://doi.org/10.1016/s0039-6028(98)00595-0
Abstract
No abstract availableKeywords
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