A simple, reliable technique for making electrical contact to multiwalled carbon nanotubes
- 11 January 1999
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 74 (2) , 323-325
- https://doi.org/10.1063/1.123011
Abstract
A simple method of making reliable electrical contact to multiwalled carbon nanotubes is described. With these contacts, current in the mA range can be routinely passed through individual multiwalled nanotubes without adverse consequences, thus allowing their resistance to be measured using a common multimeter. The contacts are robust enough to withstand temperature excursions between room temperature and 77 K. I(V) data from different multiwalled nanotubes are presented and analyzed.Keywords
This publication has 16 references indexed in Scilit:
- Spin Splitting and Even-Odd Effects in Carbon NanotubesPhysical Review Letters, 1998
- Contacting carbon nanotubes selectively with low-ohmic contacts for four-probe electric measurementsApplied Physics Letters, 1998
- Carbon Nanotube Quantum ResistorsScience, 1998
- Multiprobe Transport Experiments on Individual Single-Wall Carbon NanotubesPhysical Review Letters, 1998
- Room-temperature transistor based on a single carbon nanotubeNature, 1998
- Carbon-based electronicsNature, 1998
- Individual single-wall carbon nanotubes as quantum wiresNature, 1997
- Quantum conductance of carbon nanotubes with defectsPhysical Review B, 1996
- Electrical conductivity of individual carbon nanotubesNature, 1996
- Helical microtubules of graphitic carbonNature, 1991