Mosaic crystal X-ray spectrometer to resolve inelastic background from anomalous scattering experiments
- 1 May 1990
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 291 (1-2) , 110-116
- https://doi.org/10.1016/0168-9002(90)90043-6
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
- A maximum entropy method of determining the partial distribution functions of multicomponent amorphous materialsJournal of Non-Crystalline Solids, 1989
- The ORNL beamline at the National Synchrotron Light SourceNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1988
- Liquid GeBr4. I. A test of the anomalous x-ray scattering method as applied to disordered materialsThe Journal of Chemical Physics, 1987
- Study of Local Atomic Order in a Ternary Cu0.47Ni0.29Zn0.24Alloy Using Anomalous Scattering of Synchrotron RadiationJournal of the Physics Society Japan, 1985
- Reliability of partial structure factors determined by anomalous dispersion of x-raysPhysical Review B, 1982
- Resonant Raman scattering of x rays: Evidence forscatteringPhysical Review A, 1979
- Doubly curved crystal point-focusing x-ray monochromators: geometrical and practical opticsApplied Optics, 1977
- X-Ray Resonant Raman Scattering: Observation of Characteristic Radiation Narrower than the Lifetime WidthPhysical Review Letters, 1976
- Inelastic Resonance Emission of X Rays: Anomalous Scattering Associated with Anomalous DispersionPhysical Review Letters, 1974
- Röntgenspektroskopie und Abbildung mittels gekrümmter Kristallreflektoren. I. Geometrisch‐optische BetrachtungenAnnalen der Physik, 1933