Brillouin Scattering in Layered Semiconductors using Microprocessor-controlled Fabry-Perot Interferometer
- 1 January 1981
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 20 (S3)
- https://doi.org/10.7567/jjaps.20s3.255
Abstract
A microprocessor-controlled multipassed Fabry-Perot interferometer has been developed for high-resolution and high-contrast Brillouin scattering spectroscopy. Using this interferometer, Brillouin scattering experiments have been carried out for GaSe1-x S x mixed crystals having layered structures. Specific features of Brillouin scattering in the layered crystals were presented. Anomalous discontinuities of elastic constants of C 44 and C 33, related to the shearing and stretching force constants, have been found at the compositional ratios x≃0 and x≃0.4, which are related to the ε-γ and γ-β polytype transformations.Keywords
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