The Measurement of Conductivity and Permittivity of Semiconductor Spheres by an Extension of the Cavity Perturbation Method
- 1 November 1961
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 9 (6) , 545-551
- https://doi.org/10.1109/tmtt.1961.1125387
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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- Measurement of Microwave Dielectric Constants and Tensor Permeabilities of Ferrite SpheresProceedings of the IRE, 1956
- A microwave resonant cavity method for measuring the resistivity of semi-conducting materialsBritish Journal of Applied Physics, 1956
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- On the Magnetic Resonance Absorption in ConductorsJournal of Applied Physics, 1952
- Measurement of the Dielectric Constant and Loss of Solids and Liquids by a Cavity Perturbation MethodJournal of Applied Physics, 1949
- Microwave ElectronicsReviews of Modern Physics, 1946