Observation of microstructure and damage in materials by phase sensitive radiography and tomography
- 1 May 1997
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 81 (9) , 5878-5886
- https://doi.org/10.1063/1.364374
Abstract
The novel possibilities of phase feature detection in radiography at a third generation synchrotron radiation source are used to image, both in projection and in computed tomography, a cracked silicon single crystal and metal matrix composites strained in tension. Through an instrumentally very simple technique, based on Fresnel diffraction, phase jumps related to the interface between the matrix and the reinforcing phases of the composites are detected even when these phases show very similar x-ray attenuation. Strain-induced cracks with openings below the micrometer range are also visible through the phase modulation they introduce, illustrating the potential of the technique for assessing damage in materials with improved resolution and sensitivity.This publication has 19 references indexed in Scilit:
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