Interface characterization in fully depleted SOI MOSFETs by dynamic transconductance
- 4 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Analytical modeling of transfer admittance in small MOSFETs and application to interface state characterisationSolid-State Electronics, 1988
- Interface Properties and Recombination Mechanisms in Simox StructuresPublished by Springer Nature ,1988