A Fourier spectrometer for dispersive reflection measurements on highly absorbing solids in the far-infrared at temperatures down to 4.2 K
- 31 December 1978
- journal article
- Published by Elsevier in Infrared Physics
- Vol. 18 (5-6) , 565-570
- https://doi.org/10.1016/0020-0891(78)90071-4
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Determination of the complex refractive indices of solids in the far-infrared by dispersive fourier transform spectroscopy—II. Pseudo-displacive ferroelectrics∗Infrared Physics, 1978
- Determination of the complex refractive indices of solids in the far-infrared by dispersive Fourier transform spectroscopy—I. Alkali halidesInfrared Physics, 1978
- Improvements in dispersive reflection spectroscopy using a commercial Michelson interferometerInfrared Physics, 1977
- Far infrared measurements on KH2PO4 using dispersive reflection spectroscopyInfrared Physics, 1977
- Measurement of the complex far infrared reflectivity of KBr at 100 and 300KInfrared Physics, 1976
- Automated far-infrared fourier interferometer for amplitude-phase spectroscopy at low temperaturesInfrared Physics, 1976
- Dispersive reflection spectroscopy in the far infrared by division of the field of view in a Michelson interferometerInfrared Physics, 1974
- An amplitude Fourier spectrometer for infrared solid state spectroscopyOptics Communications, 1973
- Far-Infrared Optical Properties of KCl and KBrPhysical Review B, 1969
- Dielectric dispersion and the structures of ionic latticesProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1969