FACTORS AFFECTING OPTICAL LIMITING AND SCANNING WITH THIN NONLINEAR SAMPLES
- 1 October 1993
- journal article
- research article
- Published by World Scientific Pub Co Pte Ltd in Journal of Nonlinear Optical Physics & Materials
- Vol. 02 (04) , 613-629
- https://doi.org/10.1142/s021819919300036x
Abstract
Descriptions of the optical transmission from simple devices designed to behave as optical power limiters have been studied in both the weak and strong nonlinear regimes. The models investigated feature an active medium whose third-order nonlinear susceptibility possesses both a refractive (real) and absorptive (imaginary) component. It has been found that the behaviour of the transmission with strong nonlinearities differs markedly from that with weak nonlinearities. Specific effects investigated are those associated with variations in the position of the sample, the beam shape, the size of the exit aperture and the ratio of the nonlinear refractive and absorptive coefficients. Some useful expressions have been derived for the aperture correction factors within different scanning regimes. These allow the maximum change calculated for the normalised transmissivity of a pinhole to be easily extended to any finite aperture size.Keywords
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