Time-of-flight spectrometry for materials analysis
- 1 April 1990
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 50 (1-4) , 167-171
- https://doi.org/10.1016/0168-583x(90)90351-t
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Light elements depth-profiling using time-of-flight and energy detection of recoilsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
- Transport theory for kinetic emission of secondary electrons from solidsPhysical Review B, 1980
- Compound semiconductors surface characterization by high resolution Rutherford backscatteringNuclear Instruments and Methods, 1979