Temperature dependence of the resistivity of CuFe thin films with Fe concentrations above 0.1 at.%

Abstract
The resistivity of low-temperature condensed CuFe thin films was measured in the range 1.5T17 K. Fe concentrations ranged from ∼0.04 to ∼0.9 at.%. The resistivity exhibited an approximately logarithmic rise down to ∼10 K and a less rapid rise below 10 K. The logarithmic slope per at.% Fe of the resistivity curve decreased with increasing Fe concentration. The change in (1c)(dρdlnT) is interpreted as resulting from interactions between the Fe atoms.