Temperature dependence of the resistivity of CuFe thin films with Fe concentrations above 0.1 at.%
- 1 May 1977
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 15 (9) , 4336-4340
- https://doi.org/10.1103/physrevb.15.4336
Abstract
The resistivity of low-temperature condensed CuFe thin films was measured in the range K. Fe concentrations ranged from ∼0.04 to ∼0.9 at.%. The resistivity exhibited an approximately logarithmic rise down to ∼10 K and a less rapid rise below 10 K. The logarithmic slope per at.% Fe of the resistivity curve decreased with increasing Fe concentration. The change in is interpreted as resulting from interactions between the Fe atoms.
Keywords
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