A comparison of AC and DC electrochemical etching techniques for the fabrication of tungsten whiskers
- 1 April 1978
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 11 (5) , 761-764
- https://doi.org/10.1088/0022-3727/11/5/019
Abstract
Examination under a 1 MeV electron microscope has shown that the tip radius is comparable in both cases, and in the region 5-10 nm. The AC method, however, produces more robust whiskers with larger cone angles and is probably more suitable for the manufacture of whiskers used in metal-insulator-metal diodes.Keywords
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