Comparison of tungsten and nickel oxideelectrochromism in single films and in all-solid-state devices
- 31 December 1990
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 193-194, 409-417
- https://doi.org/10.1016/s0040-6090(05)80051-3
Abstract
No abstract availableKeywords
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- Advances in Small Spot ESCAMRS Bulletin, 1987
- Recent developments in spatially resolved ESCASurface and Interface Analysis, 1987