Measurement of Thickness of Thin Water Film in Two-Phase Flow by Capacitance Method
- 1 January 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 29 (1) , 688-694
- https://doi.org/10.1109/tns.1982.4335938
Abstract
A technique has been developed for measuring water film thickness in a two-phase annular flow system by the capacitance method. An experimental model of the flow system with two types of electrodes mounted on the inner wall of a cylindrical tube has been constructed and evaluated. The apparatus and its ability to observe fluctuations and wave motions of the water film passing over the electrodes is described in some detail.Keywords
This publication has 2 references indexed in Scilit:
- Local Film Thickness During Transient Voiding of a Liquid-Filled ChannelJournal of Heat Transfer, 1976
- A capacitance method for measurement of film thickness in two-phase flowReview of Scientific Instruments, 1973