Interface fluctuations in random media
- 1 April 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 43 (8) , 4551-4554
- https://doi.org/10.1103/physreva.43.4551
Abstract
We study a stochastic model of an interface moving through a random medium. This model differs from the standard Kardar-Parisi-Zhang equation by the fact that the fluctuations are quenched random variables. We find an intermediate scaling regime with roughness exponent approximately equal to 0.75; this compares favorably with recent experiments [M. A. Rubio, C. A. Edwards, A. Dougherty, and J. P. Goilub, Phys. Rev. Lett. 63, 1685 (1989)] on multiphase flow through a bead pack.Keywords
This publication has 10 references indexed in Scilit:
- Kinetic roughening of Laplacian frontsPhysical Review Letters, 1991
- Self-affine fractal interfaces from immiscible displacement in porous mediaPhysical Review Letters, 1989
- Burgers equation with correlated noise: Renormalization-group analysis and applications to directed polymers and interface growthPhysical Review A, 1989
- Noise reduction in Eden models: II. Surface structure and intrinsic widthJournal of Physics A: General Physics, 1988
- Ballistic deposition on surfacesPhysical Review A, 1986
- Dynamic Scaling of Growing InterfacesPhysical Review Letters, 1986
- Scaling properties of the surface of the Eden model in d=2, 3, 4Journal of Physics A: General Physics, 1985
- Interface moving through a random backgroundPhysical Review B, 1985
- Interface Motion and Nonequilibrium Properties of the Random-Field Ising ModelPhysical Review Letters, 1984
- Surface tension, roughening, and lower critical dimension in the random-field Ising modelPhysical Review B, 1983