Helium deposition profiles from self-shielded alpha sources
- 1 January 1982
- journal article
- research article
- Published by Taylor & Francis in Radiation Effects
- Vol. 66 (3) , 211-216
- https://doi.org/10.1080/00337578208222480
Abstract
The use of 238Pu and 244Cm alpha sources for helium deposition into thin foils leads to different concentration profiles than are obtained with ion accelerators. The major differences arise due to isotropic emission in the source as opposed to normal incidence beams, and also due to self-shielding within the source. Using a source-target sandwich technique for typical pre-thinned foil applications leads to deposition profiles which are completely uniform, and also yields a substantial saving in time, effort and money compared to other alpha implantation techniques.Keywords
This publication has 2 references indexed in Scilit:
- Injecting Irradiation Samples with a Uniform Concentration of Helium Using Curium-244Nuclear Technology, 1978
- Effective Alpha Activity and Self-Absorption Alpha Range in238PuO2MicrospheresNuclear Applications and Technology, 1970