Simulation Measurement of Bunch Excited Fields and Energy Loss in Vacuum Chamber Components and Cavities
- 1 June 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 26 (3) , 3583-3585
- https://doi.org/10.1109/tns.1979.4330107
Abstract
Following the method of Sands and Rees, we have developed a two arm comparison apparatus of high sensitivity and good temporal resolution for the measurement of bunch engendered fields. With a relative timing uncertainty of .5 picoseconds the apparatus has demonstrated a sensitivity of .05Ω for the resistive impedance in the presence of a reactive impedance of 4.2Ω for a gaussian shaped bunch of standard deviation 2.1 centimeters. The apparatus is described and results for a typical component are presented. Both energy loss and bunch generated fields are discussed.Keywords
This publication has 0 references indexed in Scilit: