Spectroscopy with meV energy resolution
- 9 August 2001
- journal article
- Published by IOP Publishing in Journal of Physics: Condensed Matter
- Vol. 13 (34) , 7525-7537
- https://doi.org/10.1088/0953-8984/13/34/305
Abstract
Inelastic x-ray scattering has become a powerful tool in condensed matter physics in recent years. This is due to the advent of the third-generation synchrotron radiation sources, which provide an intense and collimated x-ray beam, and due to improvements in x-ray optics. This article is an introduction to the basic principles of inelastic x-ray scattering with meV resolution. In particular the geometric and crystal contributions for monochromator and analyser crystals are discussed. Also, an estimation of phonon intensities, obtained with a meV spectrometer, is derived.Keywords
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