X-Ray Investigation of Solid Helium

15 March 1970

journal article
research article
Published by AIP Publishing in Journal of Applied Physics

Vol. 41 (4) , 1451-1454
https://doi.org/10.1063/1.1659055

Abstract

Specimens of hcp ⁴He used for thermal conductivity measurements have been examined by an x‐ray method. This method is described and several Laue photographs are shown. These photographs are an excellent test of specimen quality. The number of reflections observed for high‐quality crystals is sufficient for orientation determinations.

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