Electrochromic Memory Degradation in WOx–LiClO4/PC Cells
- 1 April 1982
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 21 (4R) , 655-658
- https://doi.org/10.1143/jjap.21.655
Abstract
Electrochromic memory degradation in Li y WO x has been investigated. When the external circuit connection has a resistor, which is important for a practical display use, the degradation mechanism has been explained by the capacitor discharge model. This model presents an estimation method for determining capacitance and EMF (electromotive force) for a cell. In the case of an open circuit, it has been proved that the simple diffusion theory could be adopted. Several factors, which improve the electrochromic open-circuit memory, have been considered.Keywords
This publication has 5 references indexed in Scilit:
- A Modified Model for the Mechanism of Symmetric Electrochromic CellsJapanese Journal of Applied Physics, 1980
- Electrochromism in Li x WO 3Journal of the Electrochemical Society, 1978
- Solid state electrochromic cells: the M-β-alumina/WO3 systemThin Solid Films, 1977
- Theory and measurement of the change in chemical potential of hydrogen in amorphous HxWO3 as a function of the stoichiometric parameter xSolid State Communications, 1976
- Electrochemichromic Systems for Display ApplicationsJournal of the Electrochemical Society, 1975