Testing for Bridging Faults (Shorts) in CMOS Circuits

Publisher Website

1 January 1983

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 717-718
https://doi.org/10.1109/dac.1983.1585734

Abstract

No abstract available

This publication has 2 references indexed in Scilit:

Verification Testing
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1982
On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic Nets
IEEE Transactions on Electronic Computers, 1966