Performance and Reliability Issues of SiC-Schottky Diodes

• 10 May 2000
• journal article
• Published by Trans Tech Publications, Ltd. in Materials Science Forum
• Vol. 338-342, 1167-1170
• https://doi.org/10.4028/www.scientific.net/msf.338-342.1167

Abstract

Keywords

• ELECTRICAL PROPERTIES
• FAILURE MECHANICS
• OVERCURRENT LIMITATIONS
• RELIABILITY
• SCHOTTKY DIODE