Characteristics of metal-insulator-metal point-contact diodes used for two-laser mixing and direct frequency measurements
- 1 May 1973
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 9 (5) , 548-549
- https://doi.org/10.1109/jqe.1973.1077514
Abstract
The frequency response characteristics of metal-insulator-metal (MIM) diodes used for direct-frequency measurements in the submillimeter and infrared spectral region have been determined and it is found that these may be described by a simple model based on aerial impedance and barrier shunt capacitance. In addition, an MIM diode has been used to detect visible radiation from an argon ion laser.Keywords
This publication has 7 references indexed in Scilit:
- Extension of Absolute Frequency Measurements to the cw He–Ne Laser at 88 THz (3.39 μ)Applied Physics Letters, 1972
- Absolute measurement of submillimetre and far infra-red laser frequenciesRadio and Electronic Engineer, 1972
- IMPROVED COUPLING TO INFRARED WHISKER DIODES BY USE OF ANTENNA THEORYApplied Physics Letters, 1970
- ABSOLUTE FREQUENCY MEASUREMENTS OF THE CO2 cw LASER AT 28 THz (10.6μm)Applied Physics Letters, 1970
- ABSOLUTE FREQUENCY MEASUREMENTS OF THE 28- AND 78-μm cw WATER VAPOR LASER LINESApplied Physics Letters, 1970
- EXTENSION OF LASER HARMONIC-FREQUENCY MIXING TECHNIQUES INTO THE 9 μ REGION WITH AN INFRARED METAL-METAL POINT-CONTACT DIODEApplied Physics Letters, 1969
- ABSOLUTE FREQUENCY MEASUREMENT AND SPECTROSCOPY OF GAS LASER TRANSITIONS IN THE FAR INFRAREDApplied Physics Letters, 1967