The boundary-scan master: target applications and functional requirements

Publisher Website

4 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/test.1990.114037

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

A new framework for analyzing test generation and diagnosis algorithms for wiring interconnects
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003