A fast shaping amplifier-comparator integrated circuit for silicon strip detectors
- 1 August 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 40 (4) , 740-743
- https://doi.org/10.1109/23.256653
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Radiation hardness measurements on bipolar test structures and an amplifier-comparator circuitPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Noise measurements on radiation-hardened CMOS transistorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- The time slice systemNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1990