A focusing multilayer analyser for local diffraction studies

• 1 September 1999
• journal article
• research article
• Published by International Union of Crystallography (IUCr) in Journal of Synchrotron Radiation
• Vol. 6  (5) , 979-984
• https://doi.org/10.1107/s0909049599001934

Abstract

Keywords

• X-RAY OPTICS
• LATTICE STRAINS